Coulomb blockade;
focused ion beam etching;
granular film;
scanning tunneling microscopy;
single electron tunneling;
tunnel magnetoresistance;
D O I:
10.1016/S0921-5107(01)00582-7
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
We describe the microfabrication process of a granular nanobridge structure consisting of electrodes separated by a nanometer-sized gap in which a thin insulating Co-Al-O granular film is filled, and discuss the observed Coulomb blockade with a clear threshold voltage (V-th) and the enhanced tunnel magnetoresistance of about 30% at a voltage slightly above V-th. Recent results of our scanning tunneling microscopy studies to clarify the topographic features and single electron tunneling phenomena on the surface of Co-Al-O granular films are also presented. (C) 2001 Elsevier Science B.V. All rights reserved.