Decay-data metrology: Needs and future trends.

被引：0

|

作者：

Nichols, AL ^{[1
]}

机构：

[1] AEA Technol, Future Technol, Didcot OX11 0QJ, Oxon, England

来源：

ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2001年 / 221卷

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D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

86

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收藏

页码：U76 / U76

页数：1

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