Decay-data metrology: Needs and future trends.

被引：0
|
作者：
Nichols, AL [1 ]
机构：
[1] AEA Technol, Future Technol, Didcot OX11 0QJ, Oxon, England
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2001年 / 221卷
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D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
86
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页码：U76 / U76
页数：1
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