Structured CsI(Tl) scintillators for X-ray imaging applications

被引：267

作者：

Nagarkar, VV ^{[1
]}

Gupta, TK ^{[1
]}

Miller, SR ^{[1
]}

Klugerman, Y ^{[1
]}

Squillante, MR ^{[1
]}

Entine, G ^{[1
]}

机构：

[1] Radiat Monitoring Devices Inc, Watertown, MA 02172 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1998年 / 45卷 / 03期

关键词：

D O I：

10.1109/23.682433

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We are developing developing large-area, thick, structured CsI(TI) imaging sensors for a wide variety of X-ray imaging applications. Recently we have fabricated structured CsI(TI) scintillators ranging from 30 mu m (16 mg/cm(2)) to 2000 mu m (900 mg/cm(2)) in thickness and up to 15 x 15 cm(2) in area. Even 2000-mu m-thick film showed well-controlled columnar growth throughout the film. Material characterization confirmed that the film is crystalline in nature and that the stoichiometry is preserved. To improve the spatial resolution of thick films, post-deposition treatments were performed. The effect of these treatments on film characteristics was quantitatively evaluated by measuring signal output, modulation transfer function [MTF(f)], noise power spectrum [NPS(f)], and detective quantum efficiency [DQE(f)]. The data show that by proper film treatments, the film DQE(f) can be improved.

引用

页码：492 / 496

页数：5

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