A monochromator for scanning X-ray microscopy beamlines at third-generation synchrotron light sources

被引：6
|
作者：
vonBrenndorff, AI
Niemann, B
Rudolph, D
Schmahl, G
机构：
来源：
JOURNAL OF SYNCHROTRON RADIATION | 1996年 / 3卷
关键词：
monochromators; X-ray microscopy; beamline design; third-generation synchrotron light sources;
D O I：
10.1107/S0909049596004529
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A concept for a plane-grating monochromator for use at scanning X-ray microscopy beamlines at third-generation synchrotron light sources is presented. The design of the monochromator is optimized for a scanning transmission X-ray microscopy beamline at BESSY II. Ray-tracing calculations are presented which include geometric aberrations of the optics used in the beamline.
引用
收藏
页码：197 / 198
页数：2
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