The influence of substrate-target orientation on the properties of ZrN films deposited by arc ion plating

被引:3
|
作者
Du, Jun [1 ]
Zhang, Ping [1 ]
Cai, Zhihai [1 ]
Zhao, Junjun [1 ]
机构
[1] Acad Armored Force Engn, Natl Key Lab Remfg, Beijing 100072, Peoples R China
关键词
ZrN; arc ion plating; nanohardness; corrosion resistance; NITROGEN FLOW-RATE; MECHANICAL-PROPERTIES; OXIDATION BEHAVIOR; THIN-FILMS; STRESS; BIAS; TIN;
D O I
10.1016/j.phpro.2011.06.078
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The crystallograpic structure and properties of Zirconium nitride (ZrN) films deposited on 304 stainless steel were investigated. The substrates were placed either parallel with or perpendicular to the Zirconium target. The ZrN films were found to exhibit {311} orientations when substrate parrallel with target, however {220} orientation when substrates perpendicular to target. SEM results showed that the parallel ZrN films have round-shaped droplets, and perpendicular orientation ZrN films have oval-shaped droplets. The thickness of ZrN films in parallel mode is 1/2 of that in perpendicular mode. Nanoindentation results showed the hardness of ZrN films in perpendicular mode is lower than that of parallel mode. Potentiodynamic scanning results showed the corrosion resistance of films in perpendicular mode is better than that of films in parallel mode. (C) 2011 Published by Elsevier B.V. Selection and/or peer-review under responsibility of Selection and/or peer-review under responsibility of Lanzhou Institute of Physics, China.
引用
收藏
页数:6
相关论文
共 50 条
  • [41] Influence of vacuum annealing on structures and mechanical properties of Al-Ti-N films deposited by multi-arc ion plating
    Li, Mingxi
    Cai, Fei
    Zhang, Shihong
    CURRENT APPLIED PHYSICS, 2013, 13 (07) : 1470 - 1476
  • [42] MORPHOLOGY AND CRYSTAL ORIENTATION OF CHROMIUM THIN-FILMS DEPOSITED BY ION PLATING
    WANG, DD
    OKI, T
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04): : 3163 - 3167
  • [43] Influence of sputtering power and the substrate-target distance on the properties of ZrO2 films prepared by RF reactive sputtering
    Gao, PT
    Meng, LJ
    dos Santos, MP
    Teixeira, V
    Andritschky, M
    THIN SOLID FILMS, 2000, 377 : 557 - 561
  • [44] THE MORPHOLOGY AND ORIENTATION OF CR-N FILMS DEPOSITED BY REACTIVE ION PLATING
    WANG, DD
    OKI, T
    THIN SOLID FILMS, 1990, 185 (02) : 219 - 230
  • [45] Microstructure and thermal conductivity of AlN coating on Cu substrate deposited by arc ion plating
    Zhang, Yongjian
    Dai, Jingjie
    Bai, Guangzhu
    Zhang, Hailong
    MATERIALS CHEMISTRY AND PHYSICS, 2020, 241
  • [46] Effects of Substrate-Target Distance and Si Co-Doping on the Properties of Al-Doped ZnO Films Deposited by Magnetron Sputtering
    Xu Hao
    Lu Fang
    Fu Zheng-Wen
    ACTA PHYSICO-CHIMICA SINICA, 2011, 27 (05) : 1232 - 1238
  • [47] Influence of Al Content on the Microstructure and Properties of the Cr Al N Coatings Deposited by Arc Ion Plating
    Qi-Xiang Fan
    Jiao-Jiao Zhang
    Zheng-Huan Wu
    Yan-Mei Liu
    Tao Zhang
    Bing Yan
    Tie-Gang Wang
    Acta Metallurgica Sinica(English Letters), 2017, 30 (12) : 1221 - 1230
  • [48] Regulation of Substrate-Target Distance on the Microstructural, Optical and Electrical Properties of CdTe Films by Magnetron Sputtering
    Gu, Peng
    Zhu, Xinghua
    Wu, Haihua
    Yang, Dingyu
    MATERIALS, 2018, 11 (12)
  • [49] Composition, microstructure and properties of C-N-Cr films deposited by pulsed bias arc ion plating
    Li, Hongkai
    Liu, Qi
    Lin, Guoqiang
    Dong, Chuang
    Jinshu Xuebao/ Acta Metallurgica Sinica, 2009, 45 (05): : 610 - 614
  • [50] Deposition process and mechanical properties of (Ti, Al, Cr)N films deposited by multi arc ion plating
    Wang, Chuang
    Zhang, Jun
    Weixi Jiagong Jishu/Microfabrication Technology, 2008, (05): : 16 - 18