Simulations of Charge-Breeding Processes in ECRIS

被引：5

作者：

Mironov, V. ^{[1
]}

Bogomolov, S. ^{[1
]}

Bondarchenko, A. ^{[1
]}

Efremov, A. ^{[1
]}

Loginov, V. ^{[1
]}

机构：

[1] Flerov Lab Nucl React, Joint Inst Nucl Res, Dubna 141980, Moscow Reg, Russia

来源：

PROCEEDINGS OF THE 17TH INTERNATIONAL CONFERENCE ON ION SOURCES | 2018年 / 2011卷

关键词：

D O I：

10.1063/1.5053345

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Charge-breeding processes in Electron Cyclotron Resonance Ion Sources are numerically simulated by using the target helium plasma parameters obtained with NAM-ECRIS code. Breeding efficiency is obtained as a function of 1+ ion injection energy for some alkali ion beams. Time dependencies of extracted ions are calculated; typical times for reaching saturation in currents are in the range of few tens of milliseconds. Role of charge-exchange processes in breeding of ions is discussed. Recycling of ions on the source walls is shown to be important.

引用

页数：3

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