Ultraprecise studies of the thermal expansion coefficient of diamond using backscattering x-ray diffraction

被引:53
|
作者
Stoupin, Stanislav [1 ]
Shvyd'ko, Yuri V. [1 ]
机构
[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
来源
PHYSICAL REVIEW B | 2011年 / 83卷 / 10期
关键词
MOSSBAUER WAVELENGTH STANDARD; LATTICE-CONSTANT; LOW-TEMPERATURES; SINGLE-CRYSTAL; SILICON; RANGE;
D O I
10.1103/PhysRevB.83.104102
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The linear thermal expansion coefficient of diamond crystals of type IIa and type Ia was measured in the temperature range from 10 to 295 K. Neither negative thermal expansion nor any substantial difference in the thermal expansion coefficient in crystals of the different types were observed. An empirical expression was obtained that approximates the temperature dependence of the thermal expansion coefficient of diamond. The T(3) temperature dependence of a Debye solid holds below approximate to 100 K with an accuracy of approximate to 10(-8) K(-1). A slight increase in the value of the lattice parameter was found for the Ia-type crystal, which suggests lattice dilatation by nitrogen impurity. The measurements were performed using Bragg diffraction in backscattering from diamond crystals of highly monochromatic 23.7 keV x rays with the recently demonstrated high relative accuracy of 1.2 x 10(-8) in the determination of the lattice parameter [S. Stoupin and Yu. Shvyd'ko, Phys. Rev. Lett. 104, 085901 (2010)].
引用
收藏
页数:7
相关论文
共 50 条
  • [21] ON THE X-RAY DIFFRACTION SPIKES OF DIAMOND
    FRANK, FC
    PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1956, 237 (1209): : 168 - 174
  • [22] ULTRAPRECISE MEASUREMENT OF ZERO THERMAL-EXPANSION COEFFICIENT
    JACOBS, SF
    BRADFORD, JN
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1969, 59 (11) : 1521 - &
  • [23] X-RAY DIFFRACTION STUDIES OF THERMAL EFFECTS IN CRYSTALS
    BIENENSTOCK, A
    CHESSIN, H
    POST, B
    ACTA CRYSTALLOGRAPHICA, 1957, 10 (12): : 835 - 835
  • [24] Studies of the coefficient of thermal expansion of low-k ILD materials by x-ray reflectivity
    Antonelli, George A.
    Phung, Tran M.
    Mortensen, Clay D.
    Johnson, David
    Goodner, Michael D.
    Moinpour, Mansour
    MATERIALS, TECHNOLOGY AND RELIABILITY OF LOW-K DIELECTRICS AND COPPER INTERCONNECTS, 2006, 914 : 95 - +
  • [25] On the determination of linear thermal expansion coefficients of triclinic crystals using X-ray diffraction
    Paufler, P
    Weber, T
    EUROPEAN JOURNAL OF MINERALOGY, 1999, 11 (04) : 721 - 730
  • [26] On the determination of linear thermal expansion coefficients of triclinic crystals using X-ray diffraction
    Paufler, Peter
    Weber, Thomas
    European Journal of Mineralogy, 11 (04): : 721 - 730
  • [27] X-RAY STUDIES ON THERMAL EXPANSION OF RUTHENIUM DIOXIDE
    RAO, KVK
    IYENGAR, L
    ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 : 302 - +
  • [28] Thermal expansion coefficient of ScN(111) thin films grown on Si(111) determined by X-ray diffraction
    Ciprian, L.
    Mihalic, S.
    Luettich, C.
    Hoerich, F.
    Wade, E.
    Christian, B.
    Dadgar, A.
    Ambacher, O.
    APPLIED PHYSICS LETTERS, 2024, 124 (05)
  • [29] Thermal expansion coefficient of carbon-supported Pt nanoparticles: In-situ X-ray diffraction study
    Leontyev, I. N.
    Kulbakov, A. A.
    Allix, M.
    Rakhmatullin, A.
    Kuriganova, A. B.
    Maslova, O. A.
    Smirnova, N. V.
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2017, 254 (05):
  • [30] X-ray Bragg diffraction in asymmetric backscattering geometry
    Shvyd'ko, Yu. V.
    Lerche, M.
    Kuetgens, U.
    Rueter, H. D.
    Alatas, A.
    Zhao, J.
    PHYSICAL REVIEW LETTERS, 2006, 97 (23)