Quantitative contact spectroscopy by atomic-force acoustic microscopy

被引：0
|
作者：
Amelio, S [1 ]
Rabe, U [1 ]
Kester, E [1 ]
Hirsekorn, S [1 ]
Arnold, W [1 ]
机构：
[1] Fraunhofer Inst Nondestruct Testing, D-66123 Saarbrucken, Germany
来源：
MICRO MATERIALS, PROCEEDINGS | 2000年
关键词：
ferroelectric ferrites; atomic force microscopy; elastic moduli; ultrasonics;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The evaluation of the cantilever vibration spectra at ultrasonic frequencies in an AFM is presented in order to discern local elastic data quantitatively. In imaging, our technique allows e.g. to make the domains in ferroelectric ceramics visible due to their elastic contrast and anisotropy. The elasticity of nanocrystalline ferrite films was measured using the contact resonances.
引用
收藏
页码：340 / 343
页数：4
相关论文
共 50 条
  • [31] Application of atomic-force microscopy to metallography
    Yang, ZG
    Fang, HS
    Wang, JJ
    Zheng, YK
    MATERIALS LETTERS, 1995, 25 (5-6) : 209 - 212
  • [32] APPLICATIONS FOR ATOMIC-FORCE MICROSCOPY OF DNA
    HANSMA, HG
    LANEY, DE
    BEZANILLA, M
    SINSHEIMER, RL
    HANSMA, PK
    BIOPHYSICAL JOURNAL, 1995, 68 (05) : 1672 - 1677
  • [33] BIOLOGICAL APPLICATIONS OF ATOMIC-FORCE MICROSCOPY
    LAL, R
    JOHN, SA
    AMERICAN JOURNAL OF PHYSIOLOGY, 1994, 266 (01): : C1 - &
  • [34] ATOMIC-FORCE MICROSCOPY IN THE PHOTOCHEMISTRY OF CHALCONES
    KAUPP, G
    JOURNAL OF MICROSCOPY-OXFORD, 1994, 174 : 15 - 22
  • [35] ATOMIC-FORCE MICROSCOPY OF NUCLEOPROTEIN COMPLEXES
    LYUBCHENKO, YL
    JACOBS, BL
    LINDSAY, SM
    STASIAK, A
    SCANNING MICROSCOPY, 1995, 9 (03) : 705 - 727
  • [36] Atomic-force microscopy of bismuth films
    Grabov, V. M.
    Demidov, E. V.
    Komarov, V. A.
    PHYSICS OF THE SOLID STATE, 2008, 50 (07) : 1365 - 1369
  • [37] Atomic-force microscopy of bismuth films
    V. M. Grabov
    E. V. Demidov
    V. A. Komarov
    Physics of the Solid State, 2008, 50 : 1365 - 1369
  • [38] Nonlinear contact resonance spectroscopy in atomic force microscopy
    Rupp, Daniel
    Rabe, Ute
    Hirsekorn, Sigrun
    Arnold, Walter
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2007, 40 (22) : 7136 - 7145
  • [39] Polymer thin film characterization: Sum frequency generation spectroscopy, atomic-force microscopy and contact angle measurements
    Kruse, Adelaide
    Cimatu, Katherine
    Chan, Stephanie
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2016, 252
  • [40] Surface effects on elastic properties of silver nanowires: Contact atomic-force microscopy
    Jing, G. Y.
    Duan, H. L.
    Sun, X. M.
    Zhang, Z. S.
    Xu, J.
    Li, Y. D.
    Wang, J. X.
    Yu, D. P.
    PHYSICAL REVIEW B, 2006, 73 (23)
12345