The effect of annealing under hydrostatic pressure on the visible photoluminescence from Si+-ion implanted SiO2 films

被引:12
|
作者
Tyschenko, IE [1 ]
Rebohle, L
Yankov, RA
Skorupa, W
Misiuk, A
Kachurin, GA
机构
[1] Russian Acad Sci, Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia
[2] Rossendorf Inc, Forschungszentrum Rossendorf EV, Inst Ionenstrahlphys & Mat Forsch, D-01314 Dresden, Germany
[3] Inst Electron Technol, PL-02668 Warsaw, Poland
关键词
ion implantation; nanocluster; visible photoluminescence; silicon dioxide; hydrostatic pressure;
D O I
10.1016/S0022-2313(98)00103-3
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We have studied the influence of the hydrostatic pressure during annealing on the intensity of the visible photoluminescence (PL) from thermally grown SiO2 films irradiated with Si (+) ions. Post-implantation anneals have been carried out in an Ar ambient at temperatures T-a of 400 degrees C and 450 degrees C for 10 h and 1130 degrees C for 5 h at hydrostatic pressures of I bar-15 kbar. It has been found that the intensity of the 360, 460 and 600 nm PL peaks increases with rising hydrostatic pressure during low-temperature annealing. The intensity of the short-wavelength PL under conditions of hydrostatic pressure continues to rise even at T-a = 1130 degrees C. Increasing T-a leads to a shift in the PL spectra towards the ultraviolet range. The results obtained have been interpreted in terms of enhanced, pressure-mediated formation of =Si-Si= centres and small Si clusters within metastable regions of the ion-implanted SiO2. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:229 / 233
页数:5
相关论文
共 50 条
  • [1] The effect of annealing under hydrostatic pressure on the visible photoluminescence from Si+-ion implanted SiO2 films
    Tyschenko, IE
    Rebohle, L
    Yankov, RA
    Skorupa, W
    Misiuk, A
    Kachurin, GA
    LIGHT EMISSION FROM SILICON: PROGRESS TOWARDS SI-BASED OPTOELECTRONICS, 1999, 77 : 229 - 233
  • [2] An origin of orange (2 eV) photoluminescence in SiO2 films implanted with high Si+-ion doses
    I. E. Tyschenko
    Semiconductors, 2015, 49 : 1176 - 1180
  • [3] An origin of orange (2 eV) photoluminescence in SiO2 films implanted with high Si+-ion doses
    Tyschenko, I. E.
    SEMICONDUCTORS, 2015, 49 (09) : 1176 - 1180
  • [4] Visible photoluminescence from Si ion-implanted and thermally annealed SiO2 films
    Kanemitsu, Y
    Shimizu, N
    Okamoto, S
    Komoda, T
    Hemment, PLF
    Sealy, BJ
    ADVANCES IN MICROCRYSTALLINE AND NANOCRYSTALLINE SEMICONDUCTORS - 1996, 1997, 452 : 99 - 104
  • [5] Effect of ion dose and annealing mode on photoluminescence from SiO2 implanted with Si ions
    G. A. Kachurin
    A. F. Leier
    K. S. Zhuravlev
    I. E. Tyschenko
    A. K. Gutakovskii
    V. A. Volodin
    W. Skorupa
    R. A. Yankov
    Semiconductors, 1998, 32 : 1222 - 1228
  • [6] Effect of ion dose and annealing mode on photoluminescence from SiO2 implanted with Si ions
    Kachurin, GA
    Leier, AF
    Zhuravlev, KS
    Tyschenko, IE
    Gutakovskii, AK
    Volodin, VA
    Skorupa, W
    Yankov, RA
    SEMICONDUCTORS, 1998, 32 (11) : 1222 - 1228
  • [7] Optical properties of Si+-ion implanted sol-gel derived SiO2 films
    Dian, J
    Valenta, J
    Luterová, K
    Pelant, I
    Nikl, M
    Muller, D
    Grob, JJ
    Rehspringer, JL
    Hönerlage, B
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2000, 69 : 564 - 569
  • [8] Visible photoluminescence from germanium-implanted silicon oxynitride films after annealing under hydrostatic pressure
    Tyschenko, IE
    Zhuravlev, KS
    Vandyshev, EN
    Rebohle, L
    Misiuk, A
    Yankov, RA
    Skorupa, W
    DEFECTS AND DIFFUSION IN CERAMICS, 2000, 186-1 : 71 - 77
  • [9] Visible photoluminescence from Si nanocrystals fabricated inSiO2 films after annealing under hydrostatic pressure
    Zhuravlev, KS
    Tyschenko, IE
    Vandyshev, EN
    Bulytova, NV
    Misiuk, A
    Rebohle, L
    Skorupa, W
    SIBERIAN RUSSIAN WORKSHOPS AND TUTORIALS ON ELECTRON DEVICES AND MATERIALS, EDM 2002, VOL 1, PROCEEDINGS, 2002, : 25 - 27