Electronic surface error in the Si interstitial formation energy

被引:26
|
作者
Mattsson, Ann E. [1 ]
Wixom, Ryan R. [2 ]
Armiento, Rickard [3 ]
机构
[1] Sandia Natl Labs, Multiscale Dynam Mat Modeling, Albuquerque, NM 87185 USA
[2] Sandia Natl Labs, Albuquerque, NM 87185 USA
[3] Univ Bayreuth, Inst Phys, D-95440 Bayreuth, Germany
关键词
D O I
10.1103/PhysRevB.77.155211
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The results for Si interstitial formation energies differ substantially if calculated with quantum Monte Carlo (QMC) or density functional theory (DFT) techniques. In fact, not even DFT results using different exchange-correlation functionals agree well for these energies. We carefully quantify the differences between the DFT results by accurate calculations with large supercells. A similar discrepancy for vacancy formation energies in metals has previously been resolved by introducing the concept of an "electronic surface error," and this view is adopted and shown relevant also for the present DFT results for interstitials in semiconductors. The origin of the surface error for the Si interstitial is explained by careful examination of the electron density. A postcorrection for the surface error brings all the results obtained with the tested functionals close to the results of the AM05 functional. However, it remains an important puzzle that while the surface error correction aligns the DFT results, they are still in large disagreement with QMC results.
引用
收藏
页数:7
相关论文
共 50 条
  • [1] Formation energy of interstitial Si in Au-doped Si
    Suezawa, M
    DEFECT AND IMPURITY ENGINEERED SEMICONDUCTORS II, 1998, 510 : 15 - 20
  • [2] Formation energy of interstitial Si in Au-doped Si determined by optical absorption measurements of H bound to interstitial Si
    Suezawa, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1998, 37 (3A): : L259 - L261
  • [3] Interstitial atoms in tungsten:: Interaction with free surface and in situ determination of formation energy
    Neklyudov, I. M.
    Sadanov, E. V.
    Tolstolutskaja, G. D.
    Ksenofontov, V. A.
    Mazilova, T. I.
    Mikhailovskij, I. M.
    PHYSICAL REVIEW B, 2008, 78 (11):
  • [4] ELECTRONIC-STRUCTURE OF THE SELF-INTERSTITIAL IN SI
    BOGUSLAWSKI, P
    PAPP, G
    BALDERESCHI, A
    HELVETICA PHYSICA ACTA, 1983, 56 (04): : 895 - 895
  • [5] CALCULATION OF MIGRATION ENERGY OF INTERSTITIAL IN SI AND GE
    SOMA, T
    SAEKI, M
    MORITA, A
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1973, 35 (01) : 146 - 148
  • [6] EFFECT OF RELAXATION ON ELECTRONIC-ENERGY-LEVEL STRUCTURE OF SI(111) SURFACE
    BATRA, IP
    CIRACI, S
    PHYSICAL REVIEW LETTERS, 1976, 36 (03) : 170 - 173
  • [7] MIGRATION ENERGY OF INTERSTITIAL IONS IN SI AND GE
    PENNETTA, C
    BALDERESCHI, A
    SOLID STATE COMMUNICATIONS, 1982, 44 (09) : 1397 - 1400
  • [8] RELATION OF RELAXATION TO ELECTRONIC-ENERGY-LEVEL STRUCTURE ON SI(111) SURFACE
    APPELBAUM, JA
    HAMANN, DR
    PHYSICAL REVIEW LETTERS, 1976, 36 (03) : 168 - 170
  • [9] Formation and electronic states of Si nanocrystallites in amorphous Si
    Zhao, XW
    Nomura, S
    Aoyagi, Y
    Sugano, T
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1996, 198 : 847 - 852
  • [10] Formation and electronic states of Si nanocrystallites in amorphous Si
    Inst of Physical and Chemical, Research , Saitama, Japan
    J Non Cryst Solids, pt 2 (847-852):