Integral equation modeling of electrostatic interactions in atomic force microscopy

被引:0
|
作者
Shen, Y. [1 ]
Barnett, D. M. [1 ]
Pinsky, P. M. [1 ]
机构
[1] Stanford Univ, Stanford, CA 94305 USA
关键词
D O I
10.1007/978-0-8176-4671-4_27
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:237 / 246
页数:10
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