Stress analysis of electrostrictive material with an elliptic defect

被引：8
|
作者：
Jiang, Q [1 ]
Kuang, ZB [1 ]
机构：
[1] Shanghai Jiao Tong Univ, Dept Engn Mech, Shanghai 200240, Peoples R China
来源：
SCIENCE IN CHINA SERIES G-PHYSICS ASTRONOMY | 2003年 / 46卷 / 05期
关键词：
electrostriction; elliptic hole; conformal transformation;
D O I：
10.1360/03yw268
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
It is shown that the constitutive equation and electric body force used to discuss the stress analysis of electrostrictive material in some previous literature are not appropriate. This paper presents the corrected stress solution for the infinite plane with an insulated elliptic hole under an applied electrical field. The numerical result obtained for the PMN material constants show that the stress near the end of the narrow elliptic hole is the tensile stress.
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页码：492 / 500
页数：9
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