Inducing dendrite formation using an atomic force microscope tip

被引：18

作者：

Zhang, Gengxin ^{[1
]}

Weeks, Brandon L. ^{[1
]}

机构：

[1] Texas Tech Univ, Dept Chem Engn, Lubbock, TX 79409 USA

来源：

SCANNING | 2008年 / 30卷 / 03期

关键词：

explosives; AFM/other scanned probe microscopes;

D O I：

10.1002/sca.20108

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Atomic force microscope (AFM) tip-induced nucleation, and dendrite growth of vapor deposited PETN films on Si (1 0 0) have been investigated at room temperature. The AFM tip induces a change from smooth and flat morphology to islands and dendrites, which is owing to the lowering and vanishing of 2-D nucleation barrier at the tip contact area; this action gives rise to the formation of large islands in the scanned area and dendrite growth along the scanning boundary. SCANNING 30: 228-231, 2008. (c) 2008 Wiley Periodicals, Inc.

引用

页码：228 / 231

页数：4

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