Analysis method of pooled data for accelerated life testing

被引：0
|
作者：
Seki, T
Yokoyama, S
机构：
[1] Chiba Inst Technol, Dept Project Management, Narashino, Chiba 2750016, Japan
[2] Musashi Inst Technol, Dept Ind Engn, Setagaya Ku, Tokyo 1588557, Japan
来源：
MICROELECTRONICS RELIABILITY | 1998年 / 38卷 / 12期
关键词：
D O I：
10.1016/S0026-2714(98)00188-7
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper deals with the analysis method of pooled data for accelerated life testing. The moment estimators of the characteristics of life which take weights of sample size of each stress levels into consideration is proposed. The validity of this method is examined graphically through the example of the actual accelerated life test data. This consideration makes it clear that the proposed estimators fit in better with the data than the estimators by the least squares method. (C) 1998 Elsevier Science Ltd. All rights reserved.
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页码：1931 / 1934
页数：4
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