Development of Near Field Detecting Probe By Optoelectronic Elements

被引：0
|
作者：
Huang, Ming-Yang [1 ]
Hong, Shao-Nan [1 ]
Wu, Sung-Mao [1 ]
机构：
[1] Natl Univ Kaohsiung, Dept Elect Engn, Micro Elect Packaging Lab, Kaohsiung, Taiwan
来源：
2015 ASIA-PACIFIC MICROWAVE CONFERENCE (APMC), VOLS 1-3 | 2015年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper introduces a probe in particular for near field measurements of electric field and magnetic field. It has a very tiny size about 1x1x1 cm(3). The photoelectric power supply and optical signal transmission make it have smallest field distortion. It enables measurements both in the time and frequency domain. Due to standard far field measurements needs a standard and an expensive system. We can utilize this probe to measure the electromagnetic fields of electronic circuit when it is working. Then we can use specific theories to transform the near field measurements into far field.
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页数：3
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