Impulse immunity test method for digital Integrated Circuits

被引：0
|
作者：
Bakshi, ST [1 ]
Coenen, M [1 ]
机构：
[1] Philips Digital Syst Lab, EMC Competence Ctr, Eindhoven, Netherlands
来源：
PROCEEDINGS OF THE 8TH INTERNATIONAL CONFERENCE ON ELECTROMAGNETIC INTERFERENCE AND COMPATIBILITY | 2003年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A methodology is presented to test susceptibility of digital ICs for impulsive phenomenon This paper gives an explanation of the impulse immunity test strategy and the test methods developed. Some results will be discussed.
引用
收藏
页码：249 / 252
页数：4
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