Acoustic, electron and optical microscopy visualization of surface and sub-surface cracks

被引:0
|
作者
Connor, ZM [1 ]
Fine, ME [1 ]
Achenbach, JD [1 ]
机构
[1] Northwestern Univ, Ctr Qual Engn & Failure Prevent, Evanston, IL 60208 USA
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暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:1581 / 1588
页数:8
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