Debugging post-silicon fails in the IBM POWER8 bring-up lab

被引:7
|
作者
Dusanapudi, M. [1 ]
Fields, S. [2 ]
Floyd, M. S. [2 ]
Guthrie, G. L. [2 ]
Kalla, R. [2 ]
Kapoor, S. [2 ]
Leitner, L. S. [2 ]
Marino, C. F. [2 ]
McGill, J. J. [2 ]
Nahir, A. [3 ]
Reick, K. [2 ]
Shen, H. [2 ]
Wright, K. L. [1 ]
机构
[1] IBM Syst & Technol Grp, Bangalore, Karnataka, India
[2] IBM Syst & Technol Grp, Austin, TX 78758 USA
[3] IBM Res Div, Haifa Res Lab, IL-31905 Haifa, Israel
关键词
TRACE-SIGNAL SELECTION; RESTORATION;
D O I
10.1147/JRD.2014.2380272
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Debugging post-silicon fails continues to be a difficult problem that is becoming even more challenging as chips integrate more functionality and implement increasingly complicated functions. Additionally, the complexity of hardware systems, coupled with the difficulty in observing the state of the system that led to the failure, make the debugging effort a unique challenge. In this paper, we review the techniques and mechanisms used to facilitate effective debugging in the POWER8 (TM) processor post-silicon validation phase. We further describe several functional bugs and describe the debugging process that drove the identification of their root cause.
引用
收藏
页数:10
相关论文
共 6 条
  • [1] Post-Silicon Validation of the IBM POWER8 Processor
    Nahir, Amir
    Dusanapudi, Manoj
    Kapoor, Shakti
    Reick, Kevin
    Roesner, Wolfgang
    Schubert, Klaus-Dieter
    Sharp, Keith
    Wetli, Greg
    [J]. 2014 51ST ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC), 2014,
  • [2] Shift-Left Principle for Faster Post-Silicon Validation: LPDDR4 Controller Bring-up
    Rakesh, Vinodh J.
    Karayi, Jithesh Pothandy
    Mallu, Chaitanya Kumar Reddy
    Somu, Karthick
    Ghanta, Vasavi
    Peter, Timmy Eapen
    [J]. 2024 IEEE 8TH INTERNATIONAL TEST CONFERENCE INDIA, ITC INDIA 2024, 2024, : 101 - 106
  • [3] Post-Silicon Validation of the IBM POWER9 Processor
    Kolan, Tom
    Mendelson, Hillel
    Sokhin, Vitali
    Reick, Kevin
    Tsanko, Elena
    Wetli, Greg
    [J]. PROCEEDINGS OF THE 2020 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE 2020), 2020, : 999 - 1002
  • [4] Utilizing high level design information to speed up post-silicon debugging
    Fujita, Masahiro
    [J]. 2011 16TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC), 2011,
  • [5] Leveraging Pre-Silicon Verification Resources for the Post-Silicon Validation of the IBM POWER7 Processor
    Adir, Allon
    Nahir, Amir
    Shurek, Gil
    Ziv, Avi
    Meissner, Charles
    Schumann, John
    [J]. PROCEEDINGS OF THE 48TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC), 2011, : 569 - 574
  • [6] AN OPTIMIZED AND UNIFIED SYSTEM FOR FPGA POWER-UP VALIDATION TO MINIMIZE POST-SILICON CYCLING TIME
    Hua, Hua
    Han, Hongpeng
    [J]. 2015 CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE, 2015,