Investigation on the Turn-on Time of RC-Triggered Power Clamps Based on 0.18-μm BCD Process

被引:0
|
作者
Zheng, Yifei [1 ]
Jin, Xiangliang
Wu, Jianfei [1 ,2 ]
Wang, Yang [3 ]
Zhang, Ang [2 ]
Zhang, Hongli [2 ]
机构
[1] Natl Univ Def Tech, Changsha, Peoples R China
[2] Tianjin Binhai Civil Mil Integrated Innovat, Tianjin, Peoples R China
[3] Xiangtan Univ, Sch Phys & Optoelect, Xiangtan, Peoples R China
基金
美国国家科学基金会; 中国国家自然科学基金;
关键词
Power clamp; electrostatic discharge (ESD); ESD protection capability; turn-on time;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In electrostatic discharge clamp circuit (Power Clamp), turn-on time has always been a critical parameter. Four types power Clamp devices arc compared in this paper. The turn-on time is effectively adjusted by feedback and reset of MOS transistors, which is realized in 0.18-mu m BCD Process. The theoretical analysis and transmission line pulse (TLP) testing system are used to predict and characterize the ESD protection devices. Through analysis of HSPICE simulation and measurement results, it can be drawn that when the turn-on time is about 100 ns, the equivalent HBM values of power-rail ESD clamp circuit can achieve the best results (approximately 10 kV).
引用
收藏
页码:192 / 194
页数:3
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