共 3 条
- [1] Investigation of Latch-up Immunity in 0.18-μm BCD Process with Deep Trench Isolation 2024 INTERNATIONAL VLSI SYMPOSIUM ON TECHNOLOGY, SYSTEMS AND APPLICATIONS, VLSI TSA, 2024,
- [3] An 800-mA Time-Based Boost Converter in 0.18μm BCD with Right-Half-Plane Zero Elimination and 96% Power Efficiency ESSCIRC 2021 - IEEE 47TH EUROPEAN SOLID STATE CIRCUITS CONFERENCE (ESSCIRC), 2021, : 223 - 226