Charge-sharing alleviation and detection for CMOS domino circuits

Charge sharing, which occurs in any complementary metal-oxide-semiconductor (CMOS) domino gate, may degrade the output voltage level or may even cause an erroneous output value. In this paper, this problem is thoroughly investigated by considering:circuit topology and circuit function. We describe a method to measure the sensitivity [called charge-sharing (CS) vulnerability] of the CS problem for each domino gate. A method to derive the CS vulnerability and the test vector for each domino gate is suggested. We also propose a transistor reordering method to dramatically reduce the CS vulnerabilities for all domino gates so that the CS problem can be alleviated. We also prove theoretically: that a set of test vectors generated for single charge-sharing faults (SCSFs) can also detect all multiple charge-sharing faults (MCSFs), This good property significantly guarantees the test quality for the CS faults of domino circuits.