Near-Field Scanning of Stochastic Fields Considering Reduction of Complexity

被引：0

作者：

Thomas, David W. P. ^{[1
]}

Baharuddin, Mohd H. ^{[1
]}

Smartt, Christopher ^{[1
]}

Gradoni, Gabriele ^{[1
]}

Tanner, Gregor ^{[1
]}

Creagh, Stephen ^{[1
]}

Doncov, Nebojsa ^{[2
]}

Haider, Michael ^{[3
]}

Russer, Johannes A. ^{[3
]}

机构：

[1] Univ Nottingham, Dept Elect & Elect Engn, Nottingham, England

[2] Univ Nis, Fac Elect Engn, Nish, Serbia

[3] Tech Univ Munich, Inst Nanoelect, Munich, Germany

来源：

2017 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - EMC EUROPE | 2017年

关键词：

near field scanning; radiated emission; printed circuit boards; time domain measurement; stochastic fields; EMISSION;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Near-field scanning is an established technique for the efficient and accurate measurement of the radiated emissions from electronic equipment for EMC studies. Recently the use of two probes near-field has been developed for the measurement of field correlation for electronic equipment with many uncorrelated sources that essentially have a stochastic field distribution. The use of two probe scanning is however very time consuming and requires large computer resources. In this paper a study is made of the emissions from typical electronic devices to look at methods for reducing the complexity of measurement of stochastic fields.

引用

页数：6

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