共 50 条
- [15] SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPY COMBINED [J]. APPLIED PHYSICS LETTERS, 1988, 52 (26) : 2233 - 2235
- [20] Atomic Force Microscopy study of pit formation during anodic etching of aluminum [J]. PASSIVITY AND LOCALIZED CORROSION: AN INTERNATIONAL SYMPOSIUM IN HONOR OF PROFESSOR NORIO SATO, 1999, 99 (27): : 671 - 680