Fast and accurate characterization of optical components using low-coherence interferometry

被引：0
|
作者：
Dyer, SD [1 ]
Espejo, RJ [1 ]
机构：
[1] Natl Inst Stand & Technol, Div Optoelect, Boulder, CO 80305 USA
来源：
CLEO(R)/PACIFIC RIM 2001, VOL I, TECHNICAL DIGEST | 2001年
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Low-coherence interferometry yields a high-resolution measurement of a component's spectral and dispersion properties. We show that this technique can be applied to cascaded components, and this measurement is not adversely affected by other components in the system.
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页码：478 / 479
页数：2
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