Fast and accurate characterization of optical components using low-coherence interferometry

被引：0
|
作者：
Dyer, SD [1 ]
Espejo, RJ [1 ]
机构：
[1] Natl Inst Stand & Technol, Div Optoelect, Boulder, CO 80305 USA
来源：
CLEO(R)/PACIFIC RIM 2001, VOL I, TECHNICAL DIGEST | 2001年
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Low-coherence interferometry yields a high-resolution measurement of a component's spectral and dispersion properties. We show that this technique can be applied to cascaded components, and this measurement is not adversely affected by other components in the system.
引用
收藏
页码：478 / 479
页数：2
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