Observation of stacking faults in a scanning electron microscope by electron channelling contrast imaging

被引:11
|
作者
Weidner, Anja [1 ]
Glage, Alexander [1 ]
Sperling, Lutz [1 ]
Biermann, Horst [1 ]
机构
[1] Tech Univ Bergakad Freiberg, Inst Mat Engn, D-09596 Freiberg, Germany
关键词
ECCI; Stacking fault; TRIP steel; DISLOCATION-STRUCTURES; MICROSTRUCTURE; DEFORMATION; EVOLUTION; STEELS;
D O I
10.3139/146.110448
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
The electron channelling contrast imaging technique was applied in a scanning electron microscope equipped with a field emission gun and high beam current mode for imaging stacking faults, in particular in two different variants of cast TRIP steel after tensile and cyclic deformation. Besides well developed deformation bands, individual stacking faults with low dissipation width were observed in the metastable austenitic matrix.
引用
收藏
页码:3 / 5
页数:3
相关论文
共 50 条
  • [41] A Case of Leukonychia With Scanning Electron Microscope Observation
    Wang, Peng
    Yang, Hanjun
    Ran, Yuping
    Li, Conghui
    SCANNING, 2011, 33 (01) : 41 - 44
  • [42] A SCANNING ELECTRON-MICROSCOPE FOR TRENCH OBSERVATION
    SAITO, K
    YOSHIZAWA, M
    WADA, K
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (05): : 1152 - 1157
  • [43] Scanning electron microscope imaging of onychomycosis
    Scherer, WP
    Scherer, MD
    JOURNAL OF THE AMERICAN PODIATRIC MEDICAL ASSOCIATION, 2004, 94 (04) : 356 - 362
  • [44] OBSERVATION OF FERROMAGNETIC DOMAINS WITH SCANNING ELECTRON MICROSCOPE
    KAMMLOTT, GW
    JOURNAL OF APPLIED PHYSICS, 1971, 42 (12) : 5156 - &
  • [45] THE DETERMINATION OF THE TYPE OF STACKING FAULTS IN FACE CENTERED CUBIC ALLOYS BY MEANS OF CONTRAST EFFECTS IN THE ELECTRON MICROSCOPE
    ART, A
    GEVERS, R
    AMELINCKX, S
    PHYSICA STATUS SOLIDI, 1963, 3 (04): : 697 - 711
  • [46] Fundamental and experimental aspects of diffraction for characterizing dislocations by electron channeling contrast imaging in scanning electron microscope
    Kriaa, H.
    Guitton, A.
    Maloufi, N.
    SCIENTIFIC REPORTS, 2017, 7
  • [47] Fundamental and experimental aspects of diffraction for characterizing dislocations by electron channeling contrast imaging in scanning electron microscope
    H. Kriaa
    A. Guitton
    N. Maloufi
    Scientific Reports, 7
  • [48] CONTRAST AND RESOLUTION OF SCANNING-TRANSMISSION ELECTRON-MICROSCOPE IMAGING MODES
    REICHELT, R
    ENGEL, A
    ULTRAMICROSCOPY, 1986, 19 (01) : 43 - 56
  • [49] DIRECT OBSERVATION OF DEFECT CONTRAST IN HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPE
    STERN, RM
    ICHINOKA.T
    TAKASHIM.S
    HASHIMOT.H
    KIMOTO, S
    ACTA CRYSTALLOGRAPHICA SECTION A, 1972, 28 : S200 - S200
  • [50] Energy-filtered imaging in a scanning electron microscope for dopant contrast in InP
    Tsurumi, Daisuke
    Hamada, Kotaro
    Kawasaki, Yuji
    JOURNAL OF ELECTRON MICROSCOPY, 2010, 59 : S183 - S187