Sample-angle feedback for diffraction anomalous fine-structure spectroscopy

被引:3
|
作者
Cross, JO [1 ]
Elam, WT
Harris, VG
Kirkland, JP
Bouldin, CE
Sorensen, LB
机构
[1] USN, Res Lab, Washington, DC 20375 USA
[2] SFA Inc, Landover, MD 20785 USA
[3] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
[4] Univ Washington, Seattle, WA 98195 USA
关键词
diffraction anomalous fine structure; XAFS; anomalous scattering; sample-angle feedback;
D O I
10.1107/S0909049597014313
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Diffraction anomalous fine-structure (DAFS) experiments measure Bragg peak intensities as continuous functions of photon energy near a core-level excitation. Measuring the integrated intensity at each energy makes the experiments prohibitively slow; however, in many cases DAFS can be collected quickly by measuring only the peak intensity at the center of the rocking curve. A piezoelectric-actuator-driven stage has been designed and tested as part of a sample-angle feedback circuit for locking onto the maximum of the rocking curve while the energy is scanned. Although software peak-tracking requires only a simple calculation of diffractometer angles, it is found that the additional hardware feedback dramatically improves the reproducibility of the data.
引用
收藏
页码:911 / 913
页数:3
相关论文
共 50 条
  • [31] Laboratory spectroscopy and the search for variation of the fine-structure constant
    Berengut, J. C.
    Flambaum, V. V.
    LASER 2009: RECENT ACHIEVEMENTS AND FUTURE PROSPECTS, 2010, : 269 - 278
  • [32] X-RAY-DIFFRACTION EXAMINATION OF THE FINE-STRUCTURE OF POLYCRYSTALS
    KOLEROV, OK
    SKRYABIN, VG
    KALYSHENKO, MF
    LOGVINOV, AN
    YUSHIN, VD
    INDUSTRIAL LABORATORY, 1985, 51 (09): : 823 - 826
  • [33] THEORY OF ANGLE-RESOLVED PHOTOEMISSION EXTENDED FINE-STRUCTURE
    BARTON, JJ
    ROBEY, SW
    SHIRLEY, DA
    PHYSICAL REVIEW B, 1986, 34 (02): : 778 - 791
  • [34] Multiwavelenght Anomalous Diffraction (MAD) and Diffraction Anomalous Fine Structure (DAFS) in the study of structural properties of nanostructures
    Renevier, H.
    Coraux, J.
    Proietti, M. G.
    Favre-Nicolin, V.
    Daudin, B.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2007, 63 : S63 - S63
  • [35] Diffraction-anomalous-fine-structure spectroscopy applied to the study of III-V strained semiconductors
    Proietti, MG
    Renevier, H
    Hodeau, JL
    García, J
    Bérar, JF
    Wolfers, P
    PHYSICAL REVIEW B, 1999, 59 (08): : 5479 - 5492
  • [36] Diffraction anomalous fine structure investigation of InGaN quantum dots
    Piskorska, E.
    Holy, V.
    Siebert, M.
    Krause, B.
    Metzger, T. H.
    Schmidt, Th.
    Falta, J.
    Yamaguchi, T.
    Hommel, D.
    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 3, NO 6, 2006, 3 (06): : 1662 - 1666
  • [37] DETERMINATION OF AZIMUTH ANGLE, INCIDENCE ANGLE, AND CONTACT-POTENTIAL DIFFERENCE FOR LOW-ENERGY ELECTRON-DIFFRACTION FINE-STRUCTURE MEASUREMENTS
    HITCHEN, G
    THURGATE, S
    PHYSICAL REVIEW B, 1988, 38 (13): : 8668 - 8672
  • [38] EXTENDED X-RAY ABSORPTION FINE-STRUCTURE SPECTROSCOPY
    HAYES, TM
    BOYCE, JB
    SOLID STATE PHYSICS, 1982, 37 : 173 - 351
  • [39] DETERMINATION OF THE FINE-STRUCTURE PARAMETER OF MATERIALS BY X-RAY-DIFFRACTION
    KRAVCHIK, AE
    MOSHKINA, TI
    KRISTALLOGRAFIYA, 1989, 34 (03): : 681 - 688
  • [40] FINE-STRUCTURE IN TWO-DIMENSIONAL NMR CORRELATION SPECTROSCOPY
    OSCHKINAT, H
    FREEMAN, R
    JOURNAL OF MAGNETIC RESONANCE, 1984, 60 (01) : 164 - 169