Fabrication and characterization of long range surface plasmon devices based on metallic subwavelength gratings

被引：0
|
作者：
Wu, Zhi [1 ]
Sarangan, Andrew M. [1 ]
Zhan, Qiwen [1 ]
机构：
[1] Univ Dayton, Electroopt Program, Dayton, OH 45469 USA
来源：
PLASMONICS: METALLIC NANOSTRUCTURES AND THEIR OPTICAL PROPERTIES IX | 2011年 / 8096卷
关键词：
Resonance domain; subwavelength structures; metal optics; INTERFEROMETRIC LITHOGRAPHY; ELECTROOPTIC MODULATOR; LIGHT-MODULATOR; RESONANCE; FILMS; SENSORS; FILTERS;
D O I：
10.1117/12.893133
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
In this paper, long range surface plasmon devices using metallic subwavelength gratings are experimentally demonstrated. Subwavelength gold gratings are fabricated with deep UV interference lithography. Long range surface plasmon device using these subwavelength gold gratings is characterized by measuring the surface plasmon resonance reflectance curve in an attenuated total reflection setup. Surface plasmon resonance curve with approximately ten times narrower angular width than that from long range surface plasmon propagating along metallic thin films has been observed experimentally.
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页数：9
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