Near-Field Imaging of Magnetic Complex Mode Volume

被引:11
|
作者
Caselli, Niccolo [6 ]
Wu, Tong [1 ]
Arregui, Guillermo [2 ,3 ,4 ]
Granchi, Nicoletta [5 ]
Intonti, Francesca [5 ]
Lalanne, Philippe [1 ]
Gurioli, Massimo [5 ]
机构
[1] Univ Bordeaux, CNRS, Inst Opt, LP2N, F-33400 Talence, France
[2] CSIC, Catalan Inst Nanosci & Nanotechnol ICN2, Bellaterra 08193, Spain
[3] BIST, Bellaterra 08193, Spain
[4] Univ Autonoma Barcelona, Dept Fis, Bellaterra 08193, Spain
[5] Univ Florence, LENS, I-50019 Sesto Fiorentino, Italy
[6] Univ Complutense Madrid, Dept Phys Chem, E-28040 Madrid, Spain
关键词
electromagnetic resonance; magnetic light; photonic microcavity; cavity perturbation theory; mode volume; SHIFTS;
D O I
10.1021/acsphotonics.0c01943
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The non-Hermitian nature of confined photonic modes is described by the electric complex modal volume, VE, which represents a key parameter that leads to counterintuitive effects, such as negative modal contribution to the local density of states and non-Lorentzian lineshapes. Here, we address the magnetic counterpart of VE by means of near-field perturbation experiments in a photonic crystal slab cavity. We study the relevant role played by the imaginary part of the magnetic modal volume, VH, which can increase the quality factor of the confined modes by means of a local external magnetic perturbation. We show how a mapping of the spatial distribution of both the real and imaginary parts of VH can be inferred by near-field experiments employing Al-covered near-field tips. Our findings deepen the role of the magnetic component of light and could open a new route in employing metamaterials, magnetic quantum emitters, and topological photonics.
引用
收藏
页码:1258 / 1263
页数:6
相关论文
共 50 条
  • [31] Terahertz near-field imaging of electric and magnetic resonances of a planar metamaterial
    Bitzer, Andreas
    Merbold, Hannes
    Thoman, Andreas
    Feurer, Thomas
    Helm, Hanspeter
    Walther, Markus
    OPTICS EXPRESS, 2009, 17 (05): : 3826 - 3834
  • [32] Near-field imaging of ultrathin magnetic films with in-plane magnetization
    Dickson, W
    Takahashi, S
    Pollard, R
    Atkinson, R
    Zayats, AV
    JOURNAL OF MICROSCOPY-OXFORD, 2003, 209 : 194 - 198
  • [33] Near-field imaging of magnetic resonance in terahertz dielectric resonator antennas
    Lee, Wendy S. L.
    Kaltenecker, Korbinian
    Nirantar, Shruti
    Withayachumnankul, Withawat
    Walther, Markus
    Bhaskaran, Madhu
    Fischer, Bernd M.
    Sriram, Sharath
    Fumeaux, Christophe
    2016 41ST INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ), 2016,
  • [34] Spectrally resolved near-field mode imaging of vertical cavity semiconductor lasers
    Horsch, I
    Kusche, R
    Marti, O
    Weigl, B
    Ebeling, KJ
    JOURNAL OF APPLIED PHYSICS, 1996, 79 (08) : 3831 - 3834
  • [35] Complex Load of Torpedo Near-field Explosion and Its Damage Mode to Ships
    Liu W.
    Lu Y.
    Zhou Q.
    Cheng S.
    Binggong Xuebao/Acta Armamentarii, 2021, 42 (04): : 842 - 850
  • [36] Collection-mode near-field imaging with 0.5-THz pulses
    Mitrofanov, O
    Lee, M
    Hsu, JWP
    Brener, I
    Harel, R
    Federici, JF
    Wynn, JD
    Pfeiffer, LN
    West, KW
    IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2001, 7 (04) : 600 - 607
  • [37] Near-field photocurrent imaging of the optical mode profiles of semiconductor laser diodes
    Guenther, T
    Malyarchuk, V
    Tomm, JW
    Müller, R
    Lienau, C
    Luft, J
    APPLIED PHYSICS LETTERS, 2001, 78 (11) : 1463 - 1465
  • [38] Modulation imaging in reflection-mode near-field scanning optical microscopy
    Kerimo, J
    Büchler, M
    Smyrl, WH
    ULTRAMICROSCOPY, 2000, 84 (3-4) : 127 - 131
  • [39] Spectrally resolved near-field mode imaging of vertical cavity semiconductor lasers
    Univ of Ulm, Ulm, Germany
    J Appl Phys, 8 pt 1 (3831-3834):
  • [40] Magnetic Near-Field Measurement With a Differential Probe to Suppress Common Mode Noise
    Shao, Weiheng
    Fang, Wenxiao
    Chen, Rongquan
    Wang, Lei
    Tian, Xinxin
    He, Zhiyuan
    Huang, Yun
    En, Yunfei
    Han, Chunyong
    IEEE SENSORS JOURNAL, 2019, 19 (21) : 9697 - 9703