System Reliability Assessment as Components Undergo Accelerated Testing

被引：0
|
作者：
Luo, Wei [1 ]
Zhang, Chun-hua [1 ]
Tan, Yuan-yuan [1 ]
Chen, Xun [2 ]
机构：
[1] Natl Univ Def Technol, Inst Mechatron Engn, Coll Mechatron Engn & Automat, 47 Deya Rd, Changsha 410073, Hunan, Peoples R China
[2] Natl Univ Def Technol, Coll Mechatron Engn & Automat, Changsha 410073, Hunan, Peoples R China
来源：
ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM (RAMS), 2011 PROCEEDINGS | 2011年
关键词：
accelerated test; Bayesian; Beta distribution function; Fiducial distribution function;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页数：6
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