Bayesian accelerated life testing: A generalized Eyring-Birnbaum-Saunders model

被引:4
|
作者
Smit, Neill [1 ]
Raubenheimer, Lizanne [2 ]
机构
[1] North West Univ, Sch Math & Stat Sci, Potchefstroom, South Africa
[2] Rhodes Univ, Dept Stat, Grahamstown, South Africa
基金
新加坡国家研究基金会;
关键词
accelerated life testing; bayes; Birnbaum-Saunders distribution; generalized Eyring model; Markov chain monte carlo; INFERENCE;
D O I
10.1002/qre.2970
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, an accelerated life testing model using the Birnbaum-Saunders distribution and the generalized Eyring model is explored. A Bayesian approach is proposed, considering the combined effect of one thermal stressor and one non-thermal stressor. The model is demonstrated via an application to an electronics epoxy packaging ALT data set, with temperature and humidity as accelerated stressors. Markov chain Monte Carlo methods are employed to generate posterior samples for inference. A sensitivity analysis is performed via the deviance information criterion. The predictive reliability is also investigated.
引用
收藏
页码:195 / 210
页数:16
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