共 50 条
- [42] Properties of multicrystalline silicon wafers based on UMG material CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE 2011 (CSTIC 2011), 2011, 34 (01): : 1109 - 1116
- [44] mTest -: a new approach to measure material properties from microscopic specimens POLYTRONIC 2001, PROCEEDINGS, 2001, : 366 - 374
- [46] Evaluation of cord/rubber adhesion by a new fatigue test method Journal of Applied Polymer Science, 2006, 101 (04): : 2488 - 2494