Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction

被引：50

作者：

Panova, Ouliana ^{[1
,2
]}

Chen, X. Chelsea ^{[3
,4
]}

Bustillo, Karen C. ^{[2
]}

Ophus, Colin ^{[2
]}

Bhatt, Mahesh P. ^{[4
,5
]}

Balsara, Nitash ^{[3
,4
,5
]}

Minor, Andrew M. ^{[1
,2
]}

机构：

[1] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA

[2] Lawrence Berkeley Natl Lab, Mol Foundry, Natl Ctr Electron Microscopy, Berkeley, CA USA

[3] Univ Calif Berkeley, Dept Chem & Biomol Engn, Berkeley, CA 94720 USA

[4] Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA USA

[5] Lawrence Berkeley Natl Lab, Joint Ctr Energy Storage Res, Berkeley, CA USA

来源：

MICRON | 2016年 / 88卷

关键词：

TEM; STEM; Spatially resolved; Diffraction; Crystal orientation; P3HT; Polymers; Locally resolved structure; STRUCTURAL FEATURES; CRYSTAL-STRUCTURE; RADIATION-DAMAGE; MOLECULAR-WEIGHT; THIN-FILMS; POLY(3-HEXYLTHIOPHENE); MICROSCOPY; P3HT; POLY(3-ALKYLTHIOPHENES); MICROSTRUCTURE;

D O I：

10.1016/j.micron.2016.05.008

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We demonstrate a scanning electron nanobeam diffraction technique that can be used for mapping the size and distribution of nanoscale crystalline regions in a polymer blend. In addition, it can map the relative orientation of crystallites and the degree of crystallinity of the material. The model polymer blend is a 50:50 w/w mixture of semicrystalline poly(3-hexylthiophene-2,5-diyl) (P3HT) and amorphous polystyrene (PS). The technique uses a scanning electron beam to raster across the sample and acquires a diffraction image at each probe position. Through image alignment and filtering, the diffraction image dataset enables mapping of the crystalline regions within the scanned area and construction of an orientation map. (C) 2016 Elsevier Ltd. All rights reserved.

引用

页码：30 / 36

页数：7

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