Mixed-signal on-chip timing measurements

被引：5
|
作者：
Soma, M [1 ]
机构：
[1] Univ Washington, Dept Elect Engn, Seattle, WA 98195 USA
来源：
INTEGRATION-THE VLSI JOURNAL | 1998年 / 26卷 / 1-2期
基金：
美国国家科学基金会;
关键词：
mixed-signal; on-chip measurements; automatic test equipment (ATE); DC voltages;
D O I：
10.1016/S0167-9260(98)00026-1
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
On-chip test techniques to reduce the dependence on external testers and to improve high-frequency measurement accuracy have become a major focus in test research and development. This paper reviews the fundamental theory of timing measurements, a popular requirement for on-chip tests, and describes a wide range of circuit techniques to implement the theory. Results are presented to verify the circuit performance and limitations. A framework for timing measurement is proposed to benchmark further developments in this area. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：151 / 165
页数：15
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