SHI Induced Modifications in CdS/CuInSe2 Thin Film: XRD Analysis

被引：1
|
作者：
Joshi, Rajesh A. [1 ]
Taur, Vidya S. [1 ]
Ghule, Anil V. [2 ]
Sharma, Ramphal [1 ]
机构：
[1] Dr Babasaheb Ambedkar Marathwada Univ, Dept Phys, Thin Film & Nanotechnol Lab, Aurangabad 431004, Maharashtra, India
[2] Babasheb Ambedkar Marathwada Univ, Dept Phys, Aurangabad 431004, Maharashtra, India
来源：
SOLID STATE PHYSICS: PROCEEDINGS OF THE 55TH DAE SOLID STATE PHYSICS SYMPOSIUM 2010, PTS A AND B | 2011年 / 1349卷
关键词：
Thin film structure; XRD pattern; crystallite structure;
D O I：
10.1063/1.3606024
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
CuInSe2 (CIS nanostructured) thin films were prepared by ion exchange method at room temperature on ITO coated glass substrates in an alkaline medium. The as prepared thin films were irradiated by 120 MeV Au9+ swift heavy ion (SHI) at 5x10(11) and 5x10(12) ions/cm(2) fluence respectively. To study the effect of irradiation, the pristine and irradiated nanostructured thin films were characterized by X ray Diffraction (XRD) and analyzed the improvement in crystalline quality and crystallite size. The observed structural modifications discussed considering the high electronic energy deposition by 120 MeV gold heavy (Au9+) ions in CuInSe2 thin films.
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页码：647 / +
页数：2
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