X-ray and ion emission studies from subnanosecond laser-irradiated SiO2 aerogel foam targets

被引:4
|
作者
Kaur, C. [1 ,2 ]
Chaurasia, S. [1 ]
Pisal, A. A. [3 ]
Rossall, A. K. [4 ]
Munda, D. S. [1 ]
Rao, A. Venkateswara [3 ]
Deo, M. N. [1 ]
机构
[1] Bhabha Atom Res Ctr, High Pressure & Synchrotron Radiat Phys Div, Purnima Bldg, Bombay 400085, Maharashtra, India
[2] Homi Bhabha Natl Inst, Bombay 400094, Maharashtra, India
[3] Shivaji Univ, Dept Phys, Air Glass Lab, Kohlapur 416004, Maharashtra, India
[4] Univ Huddersfield, Int Inst Accelerator Applicat, Huddersfield HD1 3DH, W Yorkshire, England
关键词
X rays from laser-produced plasma; Aerogel targets; X-ray enhancement; SILICA AEROGELS; LINE EMISSION; ENHANCEMENT; TRANSPORT; PLASMA; PULSES;
D O I
10.1017/S0263034617000489
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this experiment, a comparative study of ion and X-ray emission from both a SiO2 aerogel foam and a quartz target is performed. The experiment is performed using Nd:glass laser system operated at laser energy up to 15 J with a pulse duration of 500 ps with focusable intensity of 10(13)-10(14) W/cm(2) on target. X-ray fluxes in different spectral ranges (soft and hard) are measured by using X-ray diodes covered with Al filters of thickness 5 mu m (0.9-1.56 keV) and 20 mu m (3.4-16 keV). A 2.5 times enhancement in soft X-ray flux (0.9-1.56 keV) and a decrease of 1.8 times in hard X rays (3.4-16 keV) for 50 mg/cc SiO2 aerogel foam is observed compared with the solid quartz. A decrease in the flux of the K-shell line emission spectrum of soft X rays is noticed in the case of the foam targets. The high-resolution K-shell spectra (He-like) of Si ions in both the cases are analyzed for the determination of plasma parameters by comparing with FLYCHK simulations. The estimated plasma temperature and density are T-c = 180 eV, n(e) = 7 x 10(20) cm(-3) and T-c = 190 eV, n(e) = 4 x 10(20) cm(-3) for quartz and SiO2 aerogel foam, respectively. To measure the evolution of the plasma moving away from the targets, four identical ion collectors are placed at different angles (22.5, 30, 45, and 67.5 degrees) from target normal. The angular distribution of the thermal ions are scaled as cos(n) with respect to target normal, where n = 3.8 and 4.8 for the foam and quartz, respectively. The experimental plasma volume measured from the ion collectors and shadowgraphy images are verified by a two-dimensional Eulerian radiative-hydrodynamic simulation (POLLUX code).
引用
收藏
页码:505 / 512
页数:8
相关论文
共 50 条
  • [41] FEMTOSECOND X-RAY-EMISSION FROM LASER IRRADIATED AI TARGETS
    MYSYROWICZ, A
    CHAMBARET, JP
    ANTONETTI, A
    AUDEBERT, P
    GEINDRE, JP
    GAUTHIER, JC
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1992, (126): : 119 - 124
  • [42] Femtosecond x-ray line emission from specially designed targets irradiated by short laser pulses
    Andreev, A
    Nakano, H
    Limpouch, J
    LASER-GENERATED AND OTHER LABORATORY X-RAY AND EUV SOURCES, OPTICS, AND APPLICATIONS, 2003, 5196 : 326 - 336
  • [43] POSITRON TRAP CENTERS IN X-RAY AND GAMMA-RAY IRRADIATED SIO2
    KHATRI, R
    ASOKAKUMAR, P
    NIELSEN, B
    ROELLIG, LO
    LYNN, KG
    APPLIED PHYSICS LETTERS, 1993, 63 (03) : 385 - 387
  • [44] Evaluation of laser-irradiated Ar clusters as a source for time-resolved x-ray studies
    Larsson, J
    Sjögren, A
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (05): : 2253 - 2256
  • [45] Evaluation of laser-irradiated Ar clusters as a source for time-resolved X-ray studies
    Larsson, J.
    Sjogren, A.
    Review of Scientific Instruments, 70 (05):
  • [46] Analysis of fine structure of X-ray spectra from laser-irradiated gold dot
    Yang, GH
    Zhang, JY
    Zhang, BH
    Zhou, YQ
    Li, J
    ACTA PHYSICA SINICA, 2000, 49 (12) : 2389 - 2393
  • [47] X-RAY REFLECTIVITY STUDIES OF SIO2/SI(001)
    RABEDEAU, TA
    TIDSWELL, IM
    PERSHAN, PS
    BEVK, J
    FREER, BS
    APPLIED PHYSICS LETTERS, 1991, 59 (26) : 3422 - 3424
  • [48] Laser ion acceleration and X-ray emission in mass-limited targets
    Andreev, A. A.
    Patonov, K. Yu
    2009 LASERS & ELECTRO-OPTICS & THE PACIFIC RIM CONFERENCE ON LASERS AND ELECTRO-OPTICS, VOLS 1 AND 2, 2009, : 11 - 11
  • [49] Soft X-ray emission spectroscopy of SiO2/Si structures irradiated with high-energy electrons
    S. N. Shamin
    V. R. Galakhov
    S. Kaschieva
    S. N. Dmitriev
    A.G Belov
    Journal of Materials Science: Materials in Electronics, 2003, 14 : 809 - 811
  • [50] Soft X-ray emission spectroscopy of SiO2/Si structures irradiated with high-energy electrons
    Shamin, SN
    Galakhov, VR
    Kaschieva, S
    Dmitriev, SN
    Belov, AG
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2003, 14 (10-12) : 809 - 811