A software reliability assessment method under distributed development environment with application to optimal software release problems

被引:0
|
作者
Tamura, Y [1 ]
Yamada, S [1 ]
Kimura, M [1 ]
机构
[1] Tottori Univ, Grad Sch Engn, Tottori 6808552, Japan
关键词
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Many software systems have been produced under host-concentrated development environment. At present, the software development environment has been changing into distributed one because of the progress of WS (workstation) and network computing technology. In this paper, we discuss a software reliability growth model (SRGM) which evaluates the software quality quantitatively in the system testing-phase of the distributed development environment. We perform the sensitivity analysis with changing the weight parameters for each software component. We also compare the goodness-of-fit of our model with existing two conventional SR,GM's. Besides, we find the optimal total testing time considering the total expected software maintenance cost in such distributed development environment. Such a problem is so-called an optimal software release problem. Several optimal software release problems considering host-concentrated software development process have been proposed by many researchers so far. On the other hand, few optimal software release problems for distributed development environment have been proposed. Therefore, in this paper, we formulate a maintenance cost model based on our software reliability growth model. Further, several numerical examples based on the derived optimal release policies are presented.
引用
收藏
页码:2687 / 2692
页数:6
相关论文
共 50 条
  • [1] A software reliability assessment method based on neural networks for distributed development environment
    Tamura, Y
    Yamada, S
    Kimura, M
    ELECTRONICS AND COMMUNICATIONS IN JAPAN PART III-FUNDAMENTAL ELECTRONIC SCIENCE, 2003, 86 (11): : 13 - 20
  • [2] A Software Reliability Assessment Tool for Distributed Software Development Projects
    Yoshinobu Tamura
    Shigeru Yamada
    OPSEARCH, 2005, 42 (4) : 297 - 309
  • [3] Software reliability modeling in distributed development environment
    Tamura, Y.
    Yamada, S.
    Kimura, M.
    JOURNAL OF QUALITY IN MAINTENANCE ENGINEERING, 2006, 12 (04) : 425 - +
  • [4] A neural network approach to software reliability assessment in distributed development environment
    Tamura, Y
    Yamada, S
    Kimura, M
    EIGHTH ISSAT INTERNATIONAL CONFERENCE ON RELIABILITY AND QUALITY IN DESIGN, PROCEEDINGS, 2003, : 196 - 200
  • [5] Software reliability assessment methods for integration testing in distributed development environment
    Tamura, Y
    Yamada, S
    TENTH ISSAT INTERNATIONAL CONFERENCE ON RELIABILITY AND QUALITY IN DESIGN, PROCEEDINGS, 2004, : 251 - 255
  • [6] Software reliability assessment tool for the system testing phase in distributed development environment
    Nodohara, Y
    Tamura, Y
    Yamada, S
    TENTH ISSAT INTERNATIONAL CONFERENCE ON RELIABILITY AND QUALITY IN DESIGN, PROCEEDINGS, 2004, : 304 - 308
  • [7] Software reliability growth model for a distributed development environment
    Yamada, Shigeru
    Tamura, Yoshinobu
    Kimura, Mitsuhiro
    Electronics and Communications in Japan, Part III: Fundamental Electronic Science (English translation of Denshi Tsushin Gakkai Ronbunshi), 2000, 83 (12): : 1 - 8
  • [8] A software reliability growth model for a distributed development environment
    Yamada, S
    Tamura, Y
    Kimura, M
    ELECTRONICS AND COMMUNICATIONS IN JAPAN PART III-FUNDAMENTAL ELECTRONIC SCIENCE, 2000, 83 (12): : 1 - 8
  • [9] Who solved the optimal software release problems based on Markovian software reliability model?
    Rinsaka, K
    Dohi, I
    2004 47TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL III, CONFERENCE PROCEEDINGS, 2004, : 475 - 478
  • [10] Software reliability analysis and optimal release problem based on a flexible stochastic differential equation model in distributed development environment
    Uchida, M
    Tamura, Y
    Yamada, S
    NINTH ISSAT INTERNATIONAL CONFERENCE ON RELIABILITY AND QUALITY IN DESIGN, 2003 PROCEEDINGS, 2003, : 12 - 16