Mechanisms of argon ion-beam surface modification of polystyrene

被引:36
|
作者
Zekonyte, J [1 ]
Erichsen, J [1 ]
Zaporojtchenko, V [1 ]
Faupel, F [1 ]
机构
[1] Univ Kiel, Tech Fac, D-24143 Kiel, Germany
关键词
X-ray photoelectron spectroscopy; ion bombardment; oxidation;
D O I
10.1016/S0039-6028(03)00130-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The surface characteristics of polymers are important factors determining their interfacial properties and their technological performance. Changes in physical and chemical properties of a polymer film may be induced by subjecting the material to a variety of surface modification techniques, one of which is ion-beam modification. In order to understand the underlying mechanisms X-ray photoelectron spectroscopy (XPS) was used to study the alterations of the polystyrene (PS) surface after Ar-ion treatment under well controlled conditions with low ion doses from 10(12) to 10(16) cm(-2). The ion bombardment leads to surface functionalization, loss of aromaticity, and free radical formation. Induced surface cross-linking and the formation of polar groups raised the surface glass transition temperature of PS film. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1040 / 1044
页数:5
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