共 50 条
- [2] Enhanced electrical performance for conductive atomic force microscopy [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (01):
- [4] Electrical Conductivity Characterization Of Zinc Oxide Seed Layer And Nanowire By Conductive Atomic Force Microscopy [J]. JURNAL FIZIK MALAYSIA, 2022, 43 (01): : 10018 - 10024
- [10] Atomic Force Microscopy Study of Intercalated DNA Molecules [J]. BIOPHYSICAL JOURNAL, 2020, 118 (03) : 219A - 219A