Batch-normalized Convolutional Neural Networks for Defect Detection of the Steel Strip

被引:1
|
作者
Liu, Junliang [1 ]
Zhu, Wei [1 ]
Yang, Zekun [1 ]
机构
[1] Beijing Inst Technol, 5 Zhongguancun South St, Beijing, Peoples R China
关键词
surface defect detection; convolutional neural network; batch normalization;
D O I
10.1145/3378891.3378894
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Surface defect detection uses advanced machine vision inspection technology to detect defects such as spots, pits, scratches and chromatic aberrations on the surface of the workpiece. The traditional machine vision detection method requires manual selection of defect features as the basis of defect identification, which is time-consuming and laborious and has low accuracy in defect detection. To overcome the aforementioned deficiencies, the convolutional neural network (CNN) is proposed as a deep learning model to extract the defect features autonomously in an elegant way. In this paper, two smaller convolution kernels form a parallel channel in two layers of the convolutional neural network architecture, and then the results of the operation are fused to extract multi-scale information, which increases the adaptability of the network to scale. Besides, the batch normalization (BN) is introduced into convolutional neural network to standardize the data distribution, offering an easy starting condition for training and improving the generalization characteristics of the network. A steel strip defect data sets are adopted to conform the effectiveness of the proposed method. The experimental results show that the proposed method accelerate the training process through reducing the training epoch number, the accuracy and detection consistency on the steel strip defect data sets achieve a superior performance to the existing methods.
引用
收藏
页码:1 / 4
页数:4
相关论文
共 50 条
  • [41] Detection of Retinal Changes from Illumination Normalized Fundus Images using Convolutional Neural Networks
    Adal, Kedir M.
    van Etten, Peter G.
    Martinez, Jose P.
    Rouwen, Kenneth
    Vermeer, Koenraad A.
    van Vliet, Lucas J.
    MEDICAL IMAGING 2017: COMPUTER-AIDED DIAGNOSIS, 2017, 10134
  • [42] Steel surface defect detection and segmentation using deep neural networks
    Ashrafi, Sara
    Teymouri, Sobhan
    Etaati, Sepideh
    Khoramdel, Javad
    Borhani, Yasamin
    Najafi, Esmaeil
    RESULTS IN ENGINEERING, 2025, 25
  • [43] A steel surface defect detection model based on graph neural networks
    Pang, Wenkai
    Tan, Zhi
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2024, 35 (04)
  • [44] Interpolating Convolutional Neural Networks Using Batch Normalization
    Data, Gratianus Wesley Putra
    Ngu, Kirjon
    Murray, David William
    Prisacariu, Victor Adrian
    COMPUTER VISION - ECCV 2018, PT XIII, 2018, 11217 : 591 - 606
  • [45] Normalized neural networks for fast pattern detection
    El-Bakry, HM
    Zhao, QF
    Proceedings of the International Joint Conference on Neural Networks (IJCNN), Vols 1-5, 2005, : 1889 - 1894
  • [46] Inception Dual Network for steel strip defect detection
    Liu, Zheng
    Wang, Xusheng
    Chen, Xiong
    PROCEEDINGS OF THE 2019 IEEE 16TH INTERNATIONAL CONFERENCE ON NETWORKING, SENSING AND CONTROL (ICNSC 2019), 2019, : 409 - 414
  • [47] Defect Detection of Polyethylene Gas Pipeline Based on Convolutional Neural Networks and Image Processing
    Wang, Jun-qiang
    Zha, Sixi
    Sun, Jia-chen
    Wang, Yang
    Lan, Hui-qing
    JOURNAL OF PRESSURE VESSEL TECHNOLOGY-TRANSACTIONS OF THE ASME, 2024, 146 (06):
  • [48] Surface defect detection of voltage-dependent resistors using convolutional neural networks
    Tiejun Yang
    Shan Peng
    Lin Huang
    Multimedia Tools and Applications, 2020, 79 : 6531 - 6546
  • [49] Circuit Manufacturing Defect Detection Using VGG16 Convolutional Neural Networks
    Althubiti, Sara A.
    Alenezi, Fayadh
    Shitharth, S.
    Sangeetha, K.
    Reddy, Chennareddy Vijay Simha
    WIRELESS COMMUNICATIONS & MOBILE COMPUTING, 2022, 2022
  • [50] Exploring deep fully convolutional neural networks for surface defect detection in complex geometries
    Pena, Daniel Garcia
    Perez, Diego Garcia
    Blanco, Ignacio Diaz
    Juarez, Jorge Marina
    INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2024, 134 (1-2): : 97 - 111