Novel measurement technique for the electromagnetic characterization of coating materials in the sub-THz frequency range

被引:4
|
作者
Passarelli, Andrea [1 ]
Bartosik, Hannes [1 ]
Rumolo, Giovanni [1 ]
Vaccaro, Vittorio Giorgio [2 ]
Masullo, Maria Rosaria [2 ]
Koral, Can [2 ]
Papari, Gian Paolo [2 ,3 ]
Andreone, Antonello [2 ,3 ]
Boine-Frankenheim, Oliver [4 ]
机构
[1] CERN, CH-1211 Geneva 24, Switzerland
[2] Ist Nazl Fis Nucl, Naples Unit, I-80126 Naples, Italy
[3] Univ Naples Federico II, Phys Dept, I-80126 Naples, Italy
[4] Tech Univ Darmstadt, Schlossgartenstr 8, D-64289 Darmstadt, Germany
来源
关键词
TIME-DOMAIN SPECTROSCOPY; PLATE WAVE-GUIDE; THIN-FILMS;
D O I
10.1103/PhysRevAccelBeams.21.103101
中图分类号
O57 [原子核物理学、高能物理学];
学科分类号
070202 ;
摘要
This paper describes a reliable, handy, and inexpensive measurement system to characterize, in the sub-THz frequency range, the coating materials used in the beam pipes of accelerators. The method is based on time domain measurements of an electromagnetic wave passing through a waveguide having a thin central slab, where the coating material is deposited on both sides. Two horn antennas are integrated on both sides of the device to optimize the signal collection and detection. This novel technique is tested on slabs coated with a nonevaporable getter (NEG) and allows to evaluate the surface impedance in the frequency range from 0.1 to 0.3 THz.
引用
收藏
页数:11
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