Growth and characterization of La0.8Sr0.2MnO3/Pb(Zr0.2Ti0.8)O3/La0.8Sr0.2MnO3 heterostructures for three-dimensional circuit studies

被引：3
|
作者：
Hong, X [1 ]
Xiao, F [1 ]
Reiner, JW [1 ]
Posadas, A [1 ]
Ahn, CH [1 ]
机构：
[1] Yale Univ, Dept Appl Phys, New Haven, CT 06520 USA
来源：
ANNALEN DER PHYSIK | 2004年 / 13卷 / 1-2期
关键词：
three-dimensional circuit; colossal magnetoresistance; heterostructure;
D O I：
10.1002/andp.200310035
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The structural and electronic properties of epitaxial colossal magnetoresistive oxide (CMR) / ferroelectric / CMR trilayers have been examined to investigate the feasibility of building all-oxide three-dimensional (3D) circuits. Epitaxial Pb(Zr0.2Ti0.8)O-3 (PZT) films sandwiched by ultrathin La0.8Sr0.2MnO3 (LSMO) layers have been fabricated using off-axis magnetron sputtering, with high crystalline quality and smooth surfaces having been obtained. Both the top and bottom layers of LSMO exhibit CMR behavior. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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收藏
页码：15 / 19
页数：5
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