Magnetoresistance tensor of La0.8Sr0.2MnO3

被引:45
|
作者
Bason, Y. [1 ]
Hoffman, J. [2 ]
Ahn, C. H. [2 ]
Klein, L. [1 ]
机构
[1] Bar Ilan Univ, Dept Phys, Nanomagnetism Res Ctr, Inst Nanotechnol & Adv Mat, IL-52900 Ramat Gan, Israel
[2] Yale Univ, Dept Appl Phys, New Haven, CT 06520 USA
来源
PHYSICAL REVIEW B | 2009年 / 79卷 / 09期
关键词
crystal symmetry; enhanced magnetoresistance; Hall effect; lanthanum compounds; magnetic epitaxial layers; strontium compounds; THIN-FILMS;
D O I
10.1103/PhysRevB.79.092406
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We measure the temperature dependence of the anisotropic magnetoresistance (AMR) and the planar Hall effect (PHE) in c-axis-oriented epitaxial thin films of La0.8Sr0.2MnO3 for different current directions relative to the crystal axes, and show that both AMR and PHE depend strongly on current orientation. We determine a magnetoresistance tensor, extracted to fourth order, which reflects the crystal symmetry and provides a comprehensive description of the data. We extend the applicability of the extracted tensor by determining the biaxial magnetocrystalline anisotropy in our samples.
引用
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页数:4
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