Gate-tunable giant tunneling electroresistance in van der Waals ferroelectric tunneling junctions

被引:5
|
作者
Wang, Qinqin [1 ]
Xie, Ti [1 ]
Blumenschein, Nicholas A. [2 ]
Song, Zhihao [1 ]
Hanbicki, Aubrey T. [2 ]
Susner, Michael A. [3 ]
Conner, Benjamin S. [4 ,5 ]
Low, Tony [6 ]
Wang, Jian-Ping [6 ]
Friedman, Adam L. [2 ]
Gong, Cheng [1 ]
机构
[1] Univ Maryland, Quantum Technol Ctr, Dept Elect & Comp Engn, College Pk, MD 20742 USA
[2] Lab Phys Sci, College Pk, MD 20740 USA
[3] Res Lab, Wright Patterson AFB, Mat & Mfg Directorate, Wright, OH 45433 USA
[4] Res Lab, Wright Patterson AFB, Sensors Directorate, Wright, OH 45433 USA
[5] CNR, Washington, DC 20001 USA
[6] Univ Minnesota, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA
关键词
Ferroelectric tunneling junctions (FT[!text type='Js']Js[!/text]); Gate; -tunable; Tunneling electroresistance (TER) effect;
D O I
10.1016/j.mseb.2022.115829
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Ferroelectric tunneling junctions (FTJs) have attracted great interest due to their potential applications in nonvolatile memories and neurosynaptic computing. In this work, high performance FTJs constructed with graphene and two-dimensional (2D) layered ferroelectric CuInP2S6 (CIPS) with out-of-plane polarization have been demonstrated. These van der Waals (vdW) heterostructure tunneling devices show tunneling electroresistance (TER) up to 107. Furthermore, the FTJs exhibit noticeable gate tunability, for which the on-state tunneling current can increase by 100% by applying a 50 V gate voltage through the conventional 260-nm-thick SiO2 dielectric layer. Our demonstration of gate-tunable, giant tunneling electroresistance highlights its potential in energy-efficient non-volatile memories and computing-in-memory functions.
引用
收藏
页数:5
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