Guest editorial: Electronic design for quality

被引:0
|
作者
Tarim, TB [1 ]
机构
[1] Texas Instruments Inc, Dallas, TX 75266 USA
关键词
D O I
10.1023/A:1025459006501
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:71 / 71
页数:1
相关论文
共 50 条
  • [41] Guest Editorial: Computational Issues in Experimental Design
    John Eccleston
    Statistics and Computing, 1999, 9 : 169 - 169
  • [42] THE 1988 DESIGN AUTOMATION CONFERENCE - GUEST EDITORIAL
    THAM, K
    AGRAWAL, V
    IEEE DESIGN & TEST OF COMPUTERS, 1988, 5 (06): : 5 - 7
  • [43] Formal Methods in System Design: Guest editorial
    Naval Research Laboratory, Washington, DC, United States
    不详
    Formal Methods Syst Des, 2007, 1 (1-3):
  • [44] Guest Editorial: Design and Implementation of DSP Systems
    Gross, Warren J.
    Yan, Zhiyuan
    JOURNAL OF SIGNAL PROCESSING SYSTEMS FOR SIGNAL IMAGE AND VIDEO TECHNOLOGY, 2016, 85 (01): : 1 - 3
  • [45] COMPUTATIONAL FOUNDATIONS OF ARCHITECTURAL DESIGN - GUEST EDITORIAL
    STINY, G
    ENVIRONMENT AND PLANNING B-PLANNING & DESIGN, 1986, 13 (02): : 127 - 132
  • [46] Guest Editorial: Digital Technology and Creative Design
    Meen, Teen-Hang
    Lam, Artde Donald Kin-Tak
    Prior, Stephen D.
    JOURNAL OF INTERNET TECHNOLOGY, 2016, 17 (01): : 91 - 91
  • [47] Guest Editorial: The 2018 Capstone Design Conference
    Howe, Susannah
    Smyser, Bridget
    Hart, Robert
    Stanfill, R. Keith
    INTERNATIONAL JOURNAL OF ENGINEERING EDUCATION, 2019, 35 (06) : 1883 - 1887
  • [48] Design of direct contact mechanisms - Guest editorial
    Dooner, David B.
    Lim, Teik C.
    JOURNAL OF MECHANICAL DESIGN, 2007, 129 (01) : 5 - 6
  • [49] Guest editorial for the Special Issue on Design Theory
    Flannery, Dane L.
    Horadam, Kathryn J.
    CRYPTOGRAPHY AND COMMUNICATIONS-DISCRETE-STRUCTURES BOOLEAN FUNCTIONS AND SEQUENCES, 2010, 2 (02): : 127 - 128
  • [50] Guest Editorial: The 2016 Capstone Design Conference
    Brackin, Patsy
    Howe, Susannah
    Rogers, Peter
    Stanfill, R. Keith
    Beyerlein, Steven
    Kanai, Junichi
    Vallino, Jim
    Palo, Scott
    INTERNATIONAL JOURNAL OF ENGINEERING EDUCATION, 2017, 33 (05) : 1388 - 1392