An anomalous X-ray scattering study on glassy superionic conductor (As2Se3)1-x(CuI)x using a third-generation synchrotron radiation facility

被引:4
|
作者
Usuki, T
Hosokawa, S [1 ]
Bérar, JF
机构
[1] Hiroshima Inst Technol, Ctr Mat Res Using Third Generat Synchrotron Radia, Hiroshima 7315193, Japan
[2] Yamagata Univ, Fac Sci, Dept Mat & Biol Chem, Yamagata 9908560, Japan
[3] Univ Marburg, Inst Phys Kern & Makromol Chem, D-35032 Marburg, Germany
[4] CNRS, Lab Cristallog, F-38042 Grenoble, France
关键词
anomalous X-ray scattering; glassy superionic conductor; intermediate-range order;
D O I
10.1016/j.nimb.2005.06.031
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Anomalous X-ray scattering experiments on glassy superionic conductor (As2Se3)(0.4)(CuI)(0.6) were performed at energies close to the As, Se, and Cu K edges using a new detecting system and a third-generation synchrotron radiation facility. The detecting system was composed of a graphite-crystal energy-analyzer and a NaI(TI) detector on a 40-cm-long arm. The overall energy resolution was about 60 eV, which can discriminate the elastic signal from the fluorescence and Compton contributions, and a sufficient number of scattered X-ray photons were acquired within a reasonable data collection time. The differential structure factors, Delta S-i(Q), were obtained from the detailed analyses, indicating that Delta S-As(Q) and Delta S-Se(Q) are similar to those of glassy As2Se3l except at the prepeak position, and Delta S-Cu(Q) that in liquid CuI. From these findings, it can be concluded that a pseudo-binary mixture of the As2Se3 network matrix and CuI-related conduction pathways would be a good structural model for this superionic glass. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:124 / 128
页数:5
相关论文
共 50 条
  • [1] An anomalous X-ray scattering study on glassy superionic conductor (As2Se3)0.4(AgI)0.6 using a third-generation synchrotron radiation facility
    Usuki, T.
    Hosokawa, S.
    Bérar, J. -F.
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 2006, 352 (9-20) : 1514 - 1516
  • [2] Anomalous X-ray scattering using third-generation synchrotron radiation
    Hosokawa, S.
    Berar, J. -F.
    [J]. SYNCHROTRON RADIATION INSTRUMENTATION, PTS 1 AND 2, 2007, 879 : 1743 - +
  • [3] X-ray diffraction measurement of liquid As2Se3 by using third-generation synchrotron radiation
    Kajihara, Y.
    Inui, M.
    Matsuda, K.
    Tamura, K.
    Hosokawa, S.
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 2007, 353 (18-21) : 1985 - 1989
  • [4] Anomalous X-ray scattering studies on superionic glassy (As2Se3)-(AgX) systems (X = halides)
    Hosokawa, S.
    Usuki, T.
    Boudet, N.
    Berar, J. -F
    [J]. SOLID STATE IONICS, 2009, 180 (6-8) : 517 - 521
  • [5] Partial structure analysis of glassy As2Se3 using anomalous X-ray scattering
    Hosokawa, S.
    Wang, Y.
    Pilgrim, W. -C.
    Bérar, J. -F.
    Mamedov, S.
    Boolchand, P.
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 2006, 352 (9-20) : 1517 - 1519
  • [6] Local structures in glassy and liquid As2Se3 -: an anomalous X-ray scattering study
    Hosokawa, S
    Kawakita, Y
    Pilgrim, WC
    Hensel, F
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 2001, 293 : 153 - 157
  • [7] Third-generation synchrotron radiation X-ray optics
    Freund, AK
    [J]. STRUCTURE, 1996, 4 (02) : 121 - 125
  • [8] Short- and intermediate-range atomic structure of glassy and liquid As2Se3 -: An anomalous X-ray scattering study
    Hosokawa, S
    Goldbach, A
    Boll, M
    Hensel, F
    [J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1999, 215 (01): : 785 - 789
  • [9] Transverse coherence properties of X-ray beams in third-generation synchrotron radiation sources
    Geloni, Glanluca
    Saldin, Evgeni
    Schneldmiller, Evgeni
    Yurkov, Mikhail
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2008, 588 (03): : 463 - 493
  • [10] Optical study of thin (As2Se3)1-x(AgI)x films
    Hineva, T.
    Petkova, T.
    Popov, C.
    Petkov, P.
    Reithmaier, J. P.
    Fuhrmann-Lieker, T.
    Axente, E.
    Sima, F.
    Mihailescu, C. N.
    Socol, G.
    Mihailescu, I. N.
    [J]. JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2007, 9 (02): : 326 - 329