Optical and structural properties of CsI thin film photocathode

被引:15
|
作者
Triloki [1 ]
Rai, R. [1 ]
Singh, B. K. [1 ]
机构
[1] Banaras Hindu Univ, Dept Phys, High Energy Phys Lab, Varanasi 221005, Uttar Pradesh, India
关键词
Cesium iodide; Quantum efficiency; X-ray diffraction; Transmission electron microscopy; Refractive index; Texture coefficient; QUANTUM EFFICIENCY; CONSTANTS; THICKNESS; STABILITY; DETECTOR;
D O I
10.1016/j.nima.2015.02.059
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In the present work, the performance of a cesium iodide thin film photocathode is studied in detail. The optical absorbance of cesium iodide films has been analyzed in the spectral range from 190 am to 900 nm. The optical band gap energy of 500 am thick cesium iodide film is calculated from the absorbance data using a Tauc plot. The refractive index is estimated from the envelope plot of transmittance data using Swanepoel's method. The absolute quantum efficiency measurement has been carried out in the wavelength range from 150 nm to 200 nm. The crystallographic nature and surface morphology are investigated by X-ray diffraction and transmission electron microscopy techniques. In addition, the elemental composition result obtained by energy dispersive X-ray analysis is also reported in the present work. (C) 2015 Elsevier B.V. All rights reserved
引用
收藏
页码:70 / 76
页数:7
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