Reversal of patterned Co/Pd multilayers with graded magnetic anisotropy

被引:14
|
作者
Davies, J. E. [1 ,2 ]
Morrow, P. [2 ]
Dennis, C. L. [2 ]
Lau, J. W. [2 ]
McMorran, B. [3 ]
Cochran, A. [3 ]
Unguris, J. [3 ]
Dumas, R. K. [4 ]
Greene, P. [4 ]
Liu, Kai [4 ]
机构
[1] NVE Corp, Adv Technol Grp, Eden Prairie, MN 55344 USA
[2] Natl Inst Stand & Technol, Magnet Mat Grp, Div Met, Gaithersburg, MD 20899 USA
[3] Natl Inst Stand & Technol, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA
[4] Univ Calif Davis, Dept Phys, Davis, CA 95616 USA
基金
美国国家科学基金会;
关键词
FILMS;
D O I
10.1063/1.3554256
中图分类号
O59 [应用物理学];
学科分类号
摘要
Magnetization reversal and the effect of patterning have been investigated in full-film and dot arrays of Co/Pd multilayers, using the first-order reversal curve and scanning electron microscopy with polarization analysis techniques. The effect of patterning is most pronounced in low sputtering pressure films, where the size of contiguous domains is larger than the dot size. Upon patterning, each dot must have its own domain nucleation site and domain propagation is limited within the dot. In graded anisotropy samples, the magnetically soft layer facilitates the magnetization reversal, once the reverse domains have nucleated. (C) 2011 American Institute of Physics. [doi:10.1063/1.3554256]
引用
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页数:3
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