Diagnosing realistic bridging faults with single stuck-at information

被引：36

作者：

Lavo, DB ^{[1
]}

Chess, B ^{[1
]}

Larrabee, T ^{[1
]}

Ferguson, FJ ^{[1
]}

机构：

[1] Univ Calif Santa Cruz, Dept Comp Sci, Santa Cruz, CA 95064 USA

来源：

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1998年 / 17卷 / 03期

基金：

美国国家科学基金会;

关键词：

Manuscript received July 10; 1996. This work was supported by the Semiconductor Research Corporation under Contract 93-DJ-315 and the National Science Foundation under Grant MIP-9011254. This paper was recommended by Associate Editor S. Reddy;

D O I：

10.1109/43.700723

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Successful failure analysis requires accurate fault diagnosis. This paper presents a method for diagnosing bridging faults that improves on previous methods. The new method uses single stuck-at fault signatures, produces accurate and precise diagnoses, and takes into account imperfect fault modeling; it accomplishes this by introducing the concepts of match restriction, match requirement, and match ranking.

引用

页码：255 / 268

页数：14

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