A Built-In Redundancy Analysis with a Minimized Binary Search Tree

被引：12

作者：

Cho, Hyungjun ^{[1
]}

Kang, Wooheon ^{[1
]}

Kang, Sungho ^{[1
]}

机构：

[1] Yonsei Univ, Dept Elect & Elect Engn, Seoul 120749, South Korea

来源：

ETRI JOURNAL | 2010年 / 32卷 / 04期

关键词：

BIRA; repair efficiency; binary search tree;

D O I：

10.4218/etrij.10.0210.0032

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

With the growth of memory capacity and density, memory testing and repair with the goal of yield improvement have become more important. Therefore, the development of high efficiency redundancy analysis algorithms is essential to improve yield rate. In this letter we propose an improved built-in redundancy analysis (BIRA) algorithm with a minimized binary search tree made by simple calculations. The tree is constructed until finding a solution from the most probable branch. This greatly reduces the search spaces for a solution. The proposed BIRA algorithm results in 100% repair efficiency and fast redundancy analysis.

引用

页码：638 / 641

页数：4

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